標(biāo)題: Titlebook: Atomic Force Microscopy; Bert Voigtl?nder Book 2019Latest edition Springer Nature Switzerland AG 2019 Scanning Probe Microscopy.Lock-In Te [打印本頁] 作者: Adentitious 時(shí)間: 2025-3-21 16:15
書目名稱Atomic Force Microscopy影響因子(影響力)
書目名稱Atomic Force Microscopy影響因子(影響力)學(xué)科排名
書目名稱Atomic Force Microscopy網(wǎng)絡(luò)公開度
書目名稱Atomic Force Microscopy網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Atomic Force Microscopy被引頻次
書目名稱Atomic Force Microscopy被引頻次學(xué)科排名
書目名稱Atomic Force Microscopy年度引用
書目名稱Atomic Force Microscopy年度引用學(xué)科排名
書目名稱Atomic Force Microscopy讀者反饋
書目名稱Atomic Force Microscopy讀者反饋學(xué)科排名
作者: 嘮叨 時(shí)間: 2025-3-21 23:37
https://doi.org/10.1007/1-4020-4078-4be microscopy, 2nd edn. Elsevier, Amsterdam, 2018, [.]; Golek, Mazur, Ryszka, Zuber, Appl Surf Sci 304, 11–19, 2014, [.]; Eaton, Batziou, Atomic force microscopy, vol. 1886. Humana Press, New York, 2019, [.]) include thermal drift, feedback overshoot, piezo creep, and electrical noise.作者: 協(xié)定 時(shí)間: 2025-3-22 02:04 作者: extinct 時(shí)間: 2025-3-22 08:19 作者: Mast-Cell 時(shí)間: 2025-3-22 11:42 作者: facetious 時(shí)間: 2025-3-22 15:49 作者: 弄臟 時(shí)間: 2025-3-22 19:33 作者: pulse-pressure 時(shí)間: 2025-3-22 23:50
https://doi.org/10.1007/978-981-10-3120-5ing we do not consider noise due to floor vibrations or sound, but more fundamental limits of noise due to thermal excitation of the cantilever, or due to the detection limit of the preamplifier detecting the signal.作者: 消音器 時(shí)間: 2025-3-23 05:03
Electronics and Control for Atomic Force Microscopy,dback electronics, which in AFM serves to stabilize the tip-sample distance. We close this chapter on electronics by discussing how digital-to-analog converters and analog-to-digital converters work in principle.作者: Isometric 時(shí)間: 2025-3-23 08:14 作者: gustation 時(shí)間: 2025-3-23 11:20 作者: Cytology 時(shí)間: 2025-3-23 14:04 作者: corn732 時(shí)間: 2025-3-23 21:50
Book 2019Latest editionle?primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book?is also useful?for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab..作者: 內(nèi)閣 時(shí)間: 2025-3-24 01:32 作者: Fierce 時(shí)間: 2025-3-24 02:44 作者: 鞭打 時(shí)間: 2025-3-24 10:01 作者: 蜈蚣 時(shí)間: 2025-3-24 12:27 作者: 凝視 時(shí)間: 2025-3-24 16:51 作者: Spina-Bifida 時(shí)間: 2025-3-24 20:48 作者: 盤旋 時(shí)間: 2025-3-24 23:28
Book 2019Latest editioncessfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015)?represents a substantial extension and?revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical 作者: extrovert 時(shí)間: 2025-3-25 03:21
Introduction,g a transition from microelectronics to nanoelectronics. As transistors with critical dimensions in the the single digit nanometer range are now in production, consumer electronics products contain now real nanoelectronic devices. Also in many other areas the progress toward the nanoscale is under way.作者: 保留 時(shí)間: 2025-3-25 07:29
Technical Aspects of Atomic Force Microscopy,precision. We describe the principles of operation of these actuators and present examples of specific actuators. In the following principles of vibration isolation are considered, because the amplitude of floor vibrations is much larger than the desired amplitude of the tip-sample vibrations.作者: 等待 時(shí)間: 2025-3-25 13:36 作者: construct 時(shí)間: 2025-3-25 16:01 作者: 迅速飛過 時(shí)間: 2025-3-25 20:47
Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy,Due to the interaction between tip and the surface, the resonance frequency of the cantilever changes. As shown in this chapter, an attractive force between tip and sample leads to a lower resonance frequency of the cantilever, while for repulsive tip-sample forces the resonance frequency increases.作者: 笨重 時(shí)間: 2025-3-26 01:03
Mapping of Mechanical Properties Using Force-Distance Curves,mages of elasticity, adhesion and other mechanical properties. Besides access to the mechanical properties, this mode also allows high-resolution imaging, it is a tapping mode under additional force control.作者: ostensible 時(shí)間: 2025-3-26 05:12 作者: concise 時(shí)間: 2025-3-26 10:44 作者: 有偏見 時(shí)間: 2025-3-26 13:43
Patricia Ochoa,Oscar Castillo,José SoriaHere we introduce the intermittent contact mode (or tapping mode) which is the mode that is used most frequently at ambient conditions.作者: 陶瓷 時(shí)間: 2025-3-26 17:56
Patricia Ochoa,Oscar Castillo,José SoriaIn the FM detection scheme of AFM the cantilever does not oscillate at a fixed driving frequency (as in the tapping mode), but always oscillates at resonance. If the resonance frequency shifts due to a tip-sample interaction, the cantilever oscillation frequency follows this shift.作者: 小隔間 時(shí)間: 2025-3-27 00:20
Harmonic Oscillator,In atomic force microscopy, vibrations play a central role in several areas: in vibration isolation and in dynamic atomic force microscopy. Therefore, In this chapter we will study the mechanical harmonic oscillator.作者: 使無效 時(shí)間: 2025-3-27 04:58
Cantilevers and Detection Methods in Atomic Force Microscopy,We consider basic requirements for force sensors and introduce a fabrication process for cantilevers. Subsequently, the most common detection method for measuring the cantilever deflection, the beam deflection method, is discussed in detail.作者: Forsake 時(shí)間: 2025-3-27 09:10
Intermittent Contact Mode/Tapping Mode,Here we introduce the intermittent contact mode (or tapping mode) which is the mode that is used most frequently at ambient conditions.作者: 同步信息 時(shí)間: 2025-3-27 09:43 作者: 外向者 時(shí)間: 2025-3-27 14:20 作者: 壓倒 時(shí)間: 2025-3-27 20:58
NanoScience and Technologyhttp://image.papertrans.cn/b/image/164727.jpg作者: heckle 時(shí)間: 2025-3-28 02:01 作者: Preserve 時(shí)間: 2025-3-28 02:53 作者: Condense 時(shí)間: 2025-3-28 07:47
Atomic Force Microscopy978-3-030-13654-3Series ISSN 1434-4904 Series E-ISSN 2197-7127 作者: 妨礙議事 時(shí)間: 2025-3-28 13:41
Cumulative Fatigue Damage Analysis,g a transition from microelectronics to nanoelectronics. As transistors with critical dimensions in the the single digit nanometer range are now in production, consumer electronics products contain now real nanoelectronic devices. Also in many other areas the progress toward the nanoscale is under way.作者: 奇怪 時(shí)間: 2025-3-28 15:25
https://doi.org/10.1007/1-4020-4078-4precision. We describe the principles of operation of these actuators and present examples of specific actuators. In the following principles of vibration isolation are considered, because the amplitude of floor vibrations is much larger than the desired amplitude of the tip-sample vibrations.作者: 污點(diǎn) 時(shí)間: 2025-3-28 19:18 作者: Myocarditis 時(shí)間: 2025-3-29 01:41
Patricia Ochoa,Oscar Castillo,José Soriaraphy. Before we describe the atomic force microscopy technique in detail, we consider the forces acting between tip and sample as well as the tip-sample contact mechanics. We consider also the snap-to-contact phenomenon, which can occur due to attractive tip-sample forces.作者: apropos 時(shí)間: 2025-3-29 04:43 作者: DNR215 時(shí)間: 2025-3-29 09:49
Frumen Olivas,Fevrier Valdez,Oscar Castillomages of elasticity, adhesion and other mechanical properties. Besides access to the mechanical properties, this mode also allows high-resolution imaging, it is a tapping mode under additional force control.作者: Carminative 時(shí)間: 2025-3-29 15:11 作者: 火花 時(shí)間: 2025-3-29 16:11 作者: 書法 時(shí)間: 2025-3-29 22:33 作者: investigate 時(shí)間: 2025-3-30 01:28 作者: 過分自信 時(shí)間: 2025-3-30 05:42
Cumulative Fatigue Damage Analysis,cy range. Using the lock-in technique the noise can be even much larger than the signal which can nevertheless be measured precisely. In dynamic atomic force microscopy is used for instance to detect the oscillation amplitude.作者: 衰老 時(shí)間: 2025-3-30 10:50 作者: GENUS 時(shí)間: 2025-3-30 14:30 作者: 使熄滅 時(shí)間: 2025-3-30 17:00 作者: instill 時(shí)間: 2025-3-30 20:47 作者: 呼吸 時(shí)間: 2025-3-31 04:41 作者: acetylcholine 時(shí)間: 2025-3-31 06:31
Studies in Computational IntelligenceDue to the interaction between tip and the surface, the resonance frequency of the cantilever changes. As shown in this chapter, an attractive force between tip and sample leads to a lower resonance frequency of the cantilever, while for repulsive tip-sample forces the resonance frequency increases.作者: patriot 時(shí)間: 2025-3-31 13:11
Frumen Olivas,Fevrier Valdez,Oscar Castillomages of elasticity, adhesion and other mechanical properties. Besides access to the mechanical properties, this mode also allows high-resolution imaging, it is a tapping mode under additional force control.作者: definition 時(shí)間: 2025-3-31 16:00
https://doi.org/10.1007/978-981-10-3120-5he topography signal on the sample to be measured. If atomic steps are imaged, the noise should have an amplitude much smaller than 1??. In the following we do not consider noise due to floor vibrations or sound, but more fundamental limits of noise due to thermal excitation of the cantilever, or du作者: 獸皮 時(shí)間: 2025-3-31 19:35 作者: 培養(yǎng) 時(shí)間: 2025-3-31 22:33
