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標(biāo)題: Titlebook: Applied Scanning Probe Methods V; Scanning Probe Micro Bharat Bhushan,Satoshi Kawata,Harald Fuchs Book 2007 Springer-Verlag Berlin Heidelbe [打印本頁(yè)]

作者: Traction    時(shí)間: 2025-3-21 16:51
書目名稱Applied Scanning Probe Methods V影響因子(影響力)




書目名稱Applied Scanning Probe Methods V影響因子(影響力)學(xué)科排名




書目名稱Applied Scanning Probe Methods V網(wǎng)絡(luò)公開度




書目名稱Applied Scanning Probe Methods V網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱Applied Scanning Probe Methods V被引頻次




書目名稱Applied Scanning Probe Methods V被引頻次學(xué)科排名




書目名稱Applied Scanning Probe Methods V年度引用




書目名稱Applied Scanning Probe Methods V年度引用學(xué)科排名




書目名稱Applied Scanning Probe Methods V讀者反饋




書目名稱Applied Scanning Probe Methods V讀者反饋學(xué)科排名





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Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy,mic mode. In dynamic AFM mode, a cantilever is driven to vibrate by its holder or the sample. The changes of cantilever vibration parameters (amplitude, resonance frequency, and phase angle) due to tip-sample interaction are used to reveal surface properties. Analytical and numerical models that can
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Near-Field Raman Spectroscopy and Imaging,e detection and identification, on the other hand, is a matter of ongoing active research. Raman spectroscopy can provide unambiguous molecular identification due to the welldefined vibrational energy peaks. However, in order to develop all its potential in nanotechnologies, a spatial resolution bey
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Environmental Toxicity and Evaluation due to both the enhanced excitation fields and the exploitation of metal-induced resonant electronic levels. Although the physical and chemical mechanisms underlying these phenomena are not yet fully understood, single-molecule sensitivity and sub-20 nm spatial resolution Raman imaging have been demonstrated.
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1434-4904 nning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are p
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Book 2007chnical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories w
作者: 逃避現(xiàn)實(shí)    時(shí)間: 2025-3-23 02:57
High-Frequency Dynamic Force Microscopy,tion of high-frequency DFM and small and stiff cantilevers allows a wider range of imaging parameters to be chosen, resulting in higher resolution and the choice of interaction between the tip and the sample, and represents the future of DFM.
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Environmental Responses in Plantstion of high-frequency DFM and small and stiff cantilevers allows a wider range of imaging parameters to be chosen, resulting in higher resolution and the choice of interaction between the tip and the sample, and represents the future of DFM.
作者: Hiatus    時(shí)間: 2025-3-23 11:29
Environmental Responses in Plantscan be as low as subnanometers, it reflects near-field interaction due to different mechanisms, such as mechanical, electrical and magnetic interactions. When TRmode is applied in combination with flexural interaction such as TappingMode or contact mode it is possible to study the interaction force
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Bharat Bhushan,Satoshi Kawata,Harald FuchsFirst book summarizing the state-of-the-art of this technique.Real industrial applications included.Includes supplementary material:
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NanoScience and Technologyhttp://image.papertrans.cn/b/image/160120.jpg
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https://doi.org/10.1007/978-3-540-37316-2AFM; PES; REM; Raman spectroscopy; ceramics; elasticity; liquid; microscopy; modeling; polymer; spectroscopy
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978-3-642-07211-6Springer-Verlag Berlin Heidelberg 2007
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Environmental Responses in Plantstic anisotropy, independent of the contact area..The dynamic responses of TRmode were proven to be valuable in determining non-linear harmonics of the TappingMode, dynamic friction and other surface mechanical properties.
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Integrated Cantilevers and Atomic Force Microscopes,
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,-controlled Dynamic Force Microscopy in Air and Liquids,
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