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標題: Titlebook: Applied Scanning Probe Methods II; Scanning Probe Micro Bharat Bhushan,Harald Fuchs Book 2006 Springer-Verlag Berlin Heidelberg 2006 Materi [打印本頁]

作者: Tyler    時間: 2025-3-21 17:58
書目名稱Applied Scanning Probe Methods II影響因子(影響力)




書目名稱Applied Scanning Probe Methods II影響因子(影響力)學科排名




書目名稱Applied Scanning Probe Methods II網(wǎng)絡公開度




書目名稱Applied Scanning Probe Methods II網(wǎng)絡公開度學科排名




書目名稱Applied Scanning Probe Methods II被引頻次




書目名稱Applied Scanning Probe Methods II被引頻次學科排名




書目名稱Applied Scanning Probe Methods II年度引用




書目名稱Applied Scanning Probe Methods II年度引用學科排名




書目名稱Applied Scanning Probe Methods II讀者反饋




書目名稱Applied Scanning Probe Methods II讀者反饋學科排名





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NanoScience and Technologyhttp://image.papertrans.cn/b/image/160116.jpg
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Where Do Brazil, India, and China Stand?,ponent of the spin polarization can be recorded. Finally, it is shown that with Sp-STM valuable information on the spin-resolved electronic structure and on the fundamental processes of tunneling spins may be obtained.
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Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anirameters to be studied and understood for final device engineering. PM-SNOM tailors micropolarimetry to the nanometer scale. Quantitative measurements of the birefringent and dichroic properties of single nanocrystals, thin films, organic/inorganic photonic crystals and waveguides demonstrate the wi
作者: 駭人    時間: 2025-3-24 03:10
https://doi.org/10.1007/978-3-658-16791-2pments allow to investigate the chemical composition of the sample. Together with improvements of the sensitivity and acquisition speed this has paved the way to exciting fields in nano-bioscience and nano-biotechnology.
作者: 代替    時間: 2025-3-24 09:28
Proximal Soil Sensing for Soil Monitoringrameters to be studied and understood for final device engineering. PM-SNOM tailors micropolarimetry to the nanometer scale. Quantitative measurements of the birefringent and dichroic properties of single nanocrystals, thin films, organic/inorganic photonic crystals and waveguides demonstrate the wi
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作者: gregarious    時間: 2025-3-24 17:58
Book 2006 different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must op
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Higher Harmonics in Dynamic Atomic Force Microscopy,
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Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application t
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Focused Ion Beam as a Scanning Probe: Methods and Applications,
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Spin-Polarized Scanning Tunneling Microscopy,TM allows to record constant current images which represent the electron density near the sample surface and simultaneously the spin polarization of the electron density which is related to the magnetic moment. It is shown how magnetic and topographic information can be separated using a modulation
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