作者: 不能妥協(xié) 時(shí)間: 2025-3-21 20:43
Cynthia H. Stahl,Alan J. Cimorellif a mechanical beam with an integrated sharp tip, because they have proven to be the most flexible arrangement for future developments in SPM. Details on the various AFM operation modes and their operation limits are not within the scope of this report and may be found elsewhere (8–11] and reference作者: Collected 時(shí)間: 2025-3-22 02:03 作者: 加入 時(shí)間: 2025-3-22 08:38 作者: BABY 時(shí)間: 2025-3-22 08:51 作者: 易受刺激 時(shí)間: 2025-3-22 14:36
https://doi.org/10.1007/978-1-4899-0473-7 into a capsule as depicted in Fig. 10.1. The resulting spherical assembly can hold a drug in its interior and protect it from possible degradation by enzymes. After injection in the body the drug is released via, for instance, rupture of the capsule. The ability to build large functional assemblies作者: Climate 時(shí)間: 2025-3-22 18:14
1434-4904 face modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book..978-3-642-05602-4978-3-642-35792-3Series ISSN 1434-4904 Series E-ISSN 2197-7127 作者: 神圣不可 時(shí)間: 2025-3-22 22:34
Atomic Force Microscopy with Lateral Modulationrovided by nature and civilization. If friction were not present, there would be no controlled blood flow; also, we would have difficulties in slowing down vehicles. Although the phenomenon friction does affect our being and doing at least as much as gravity or electricity does, we have not yet unde作者: 注意力集中 時(shí)間: 2025-3-23 02:38 作者: 出價(jià) 時(shí)間: 2025-3-23 05:57 作者: 有雜色 時(shí)間: 2025-3-23 12:27 作者: 神化怪物 時(shí)間: 2025-3-23 15:43
AFM Characterization of Semiconductor Line Edge Roughnessn properties of the gate such as leakage current. The International Technology Roadmap for Semiconductors (ITRS) [6] specifies a physical gate length for 2002 of 75 nm and a maximum LER of 3.9 nm. The effect of LER on the function of an electronic gate has been modeled by several studies and these m作者: figment 時(shí)間: 2025-3-23 18:24 作者: AMPLE 時(shí)間: 2025-3-24 00:37
Tip Characterization for Dimensional Nanometrologyanufacturable because performance (speed, data density) improves with miniaturization. Advanced materials, ceramics, and composites increasingly may benefit from the assessment of grain size and other aspects of nanostructure.作者: 全神貫注于 時(shí)間: 2025-3-24 06:26 作者: Goblet-Cells 時(shí)間: 2025-3-24 09:04 作者: 闡明 時(shí)間: 2025-3-24 11:18 作者: fringe 時(shí)間: 2025-3-24 17:06 作者: Tinea-Capitis 時(shí)間: 2025-3-24 19:52
Book 2004ly comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopi作者: 好忠告人 時(shí)間: 2025-3-25 00:27 作者: 音樂學(xué)者 時(shí)間: 2025-3-25 05:59
Room-Temperature Single-Electron Devices formed by AFM Nano-Oxidation Processor reproducibility of their characteristics. In this paper we describe the operation of the room-temperature single-electron memory fabricated using the atomic force microscopy (AFM) nano-oxidation process [4–6].作者: 委托 時(shí)間: 2025-3-25 09:26 作者: entail 時(shí)間: 2025-3-25 15:03 作者: 卵石 時(shí)間: 2025-3-25 18:16 作者: 兩棲動(dòng)物 時(shí)間: 2025-3-25 22:36 作者: 畏縮 時(shí)間: 2025-3-26 02:19 作者: ATP861 時(shí)間: 2025-3-26 07:55 作者: antenna 時(shí)間: 2025-3-26 08:53 作者: 粗魯?shù)娜?nbsp; 時(shí)間: 2025-3-26 12:43 作者: Moderate 時(shí)間: 2025-3-26 19:16
Sensor Technology for Scanning Probe Microscopyeashed the development of a new class of analytical tools that revolutionized surface science during the last two decades. The capability to study various surface properties on an atomic scale [5] coupled with the capability to manipulate or arrange molecular structures [6, 7] has blossomed into wha作者: 省略 時(shí)間: 2025-3-26 21:25
Tip Characterization for Dimensional Nanometrologyeuticals and other biological or medical applications) the nanometer size scale is determined by the fact that function is driven by chemistry, and the size scale is therefore that of molecules. In other cases (semiconductor electronics, data storage) sizes of components are driven to the smallest m作者: 混亂生活 時(shí)間: 2025-3-27 04:08 作者: 異常 時(shí)間: 2025-3-27 07:16
Visualization of Polymer Structures with Atomic Force Microscopynd atomic force microscopy (AFM) [1, 2]. In STM, tunneling current between a sharp metallic probe placed in close proximity to a conducting surface is used as a probing interaction. Tunneling current in the range of nanoamperes originates when a bias voltage is applied between this probe and the con作者: Aphorism 時(shí)間: 2025-3-27 11:02
Displacement and Strain Field Measurements from SPM Images reliability. Besides accelerated testing of products and components and numerical finite element analysis, mainly deformation measurement methods are looked for. They allow us to understand response of components to environmental and functional thermo-mechanical loading and are part of advanced rel作者: Obvious 時(shí)間: 2025-3-27 16:03
AFM Characterization of Semiconductor Line Edge Roughness as semiconductor chips and micro-optics. One of the key measurands is the linewidth of semiconductor features [1]. A class of AFM instruments often called CD-AFM has been developed for the purpose of measuring linewidth accurately (Fig. 9.1). The smallest linewidth or hole diameter on a semiconduct作者: 脖子 時(shí)間: 2025-3-27 19:52 作者: Freeze 時(shí)間: 2025-3-27 23:43 作者: aplomb 時(shí)間: 2025-3-28 02:30 作者: 庇護(hù) 時(shí)間: 2025-3-28 07:11
SPM Manipulation and Modifications and Their Storage Applicationsmodify a sample surface. This means that as previous microscope technology such as optical and electron microscopes has been applied to fabricate fine patterns for VLSI devices and storage devices, an application of the SPM technology to fabricate them with atomic and nanometer size can also be expe作者: dapper 時(shí)間: 2025-3-28 11:58 作者: Encoding 時(shí)間: 2025-3-28 16:22 作者: 變形 時(shí)間: 2025-3-28 20:10
French Politics, Society and Culture. The desire was to evaluate the adhesive bond and its failure involving controlled interfacial surfaces. One of the most important aspects of this interfacial control involves morphological defects, which are most easily handled by utilizing a very small surface for at least one of the interfaces, 作者: 騷擾 時(shí)間: 2025-3-29 01:08 作者: 粗語 時(shí)間: 2025-3-29 04:03
Cynthia H. Stahl,Alan J. Cimorellieashed the development of a new class of analytical tools that revolutionized surface science during the last two decades. The capability to study various surface properties on an atomic scale [5] coupled with the capability to manipulate or arrange molecular structures [6, 7] has blossomed into wha作者: 柔美流暢 時(shí)間: 2025-3-29 08:57
The MIRA Approach: Initialization,euticals and other biological or medical applications) the nanometer size scale is determined by the fact that function is driven by chemistry, and the size scale is therefore that of molecules. In other cases (semiconductor electronics, data storage) sizes of components are driven to the smallest m作者: 描述 時(shí)間: 2025-3-29 11:46
Environmental Radiation Effects on Mammalsood in order to develop fundamental understanding of adhesion, friction, wear, indentation, and lubrication processes. At most solid-solid interfaces of technological relevance, contact occurs at many asperities. Consequently the importance of investigating single asperity contacts in studies of the作者: Alveoli 時(shí)間: 2025-3-29 19:32 作者: MOTIF 時(shí)間: 2025-3-29 19:47 作者: 表示問 時(shí)間: 2025-3-30 02:13
https://doi.org/10.1007/978-981-99-2672-5 as semiconductor chips and micro-optics. One of the key measurands is the linewidth of semiconductor features [1]. A class of AFM instruments often called CD-AFM has been developed for the purpose of measuring linewidth accurately (Fig. 9.1). The smallest linewidth or hole diameter on a semiconduct作者: 一加就噴出 時(shí)間: 2025-3-30 05:28
https://doi.org/10.1007/978-1-4899-0473-7elf-assembly is abundant in nature, and living organisms are typical examples. It is the precise organization of molecules that makes possible the many functions carried out in living cells. For instance, self-assembly is responsible for the formation of liposomes, which are spherical molecular caps作者: Entirety 時(shí)間: 2025-3-30 09:13
Douglas J. Crawford-Brown,Jacqueline Michelructures is the metal-oxide field effect transistors (MOSFETs), which have been the driving force of the semiconductor industry for the past two decades. The gate length of the MOSFET has been continuously reduced in order to achieve higher switching speed and lower manufacturing cost. This critical作者: 并排上下 時(shí)間: 2025-3-30 14:09 作者: Estrogen 時(shí)間: 2025-3-30 19:31
https://doi.org/10.1007/978-94-011-4134-5modify a sample surface. This means that as previous microscope technology such as optical and electron microscopes has been applied to fabricate fine patterns for VLSI devices and storage devices, an application of the SPM technology to fabricate them with atomic and nanometer size can also be expe作者: Exhilarate 時(shí)間: 2025-3-30 21:56
Holistic Approaches to Headwater Management used the self-organized nanostructure. Some examples are the polycrystalline silicon film [1], the poly-crystal silicon dot [2], and the squeezed delta-doped GaAIAs/GaAs layer [3] for the multi-tunnel junctions and the memory node. They showed clear memory effects such as digitized threshold voltag作者: considerable 時(shí)間: 2025-3-31 02:16
https://doi.org/10.1007/978-3-642-35792-3AFM; Material Science; Physical Chemistry; ceramics; chemistry; microscopy; modeling; nanoscience; nanotribo作者: exostosis 時(shí)間: 2025-3-31 09:05
978-3-642-05602-4Springer-Verlag Berlin Heidelberg 2004作者: 感情 時(shí)間: 2025-3-31 09:53
Bharat Bhushan,Harald Fuchs,Sumio HosakaFirst book summarizing the state-of-the-art of this technique.Real industrial applications included.Includes supplementary material: 作者: opalescence 時(shí)間: 2025-3-31 15:12
