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標(biāo)題: Titlebook: Analytical Methods High-Melting Metals; H. C. Freyhardt Conference proceedings 1982 Springer-Verlag Berlin Heidelberg 1982 Atom.EXAFS.Eink [打印本頁]

作者: 兩邊在擴(kuò)散    時(shí)間: 2025-3-21 19:39
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書目名稱Analytical Methods High-Melting Metals讀者反饋學(xué)科排名





作者: ALE    時(shí)間: 2025-3-21 21:09
https://doi.org/10.1007/978-3-658-02180-1ethods like low energy electron diffraction (LEED), Auger electron spectroscopy (AES), UHV reflection high energy electron diffraction (RHEED) and others. Well-defined clean surfaces were prepared and maintained; structure and chemical compositions of the surfaces on the monatomic layer level were d
作者: Jacket    時(shí)間: 2025-3-22 03:35

作者: notion    時(shí)間: 2025-3-22 07:51
Die Kritik der Macht – die Macht der KritikThe problem, investigating metal single crystals, has gained its due place among the other problems of physical chemistry and physical metallurgy. The urgent task in the near future is the progress in physical metallurgy, physics of metals and physical chemistry at a single-crystal level.
作者: 向外供接觸    時(shí)間: 2025-3-22 10:30
Single Crystals of Refractory and Rare Metals, Alloys, and Compounds,The problem, investigating metal single crystals, has gained its due place among the other problems of physical chemistry and physical metallurgy. The urgent task in the near future is the progress in physical metallurgy, physics of metals and physical chemistry at a single-crystal level.
作者: 危險(xiǎn)    時(shí)間: 2025-3-22 13:57
https://doi.org/10.1007/978-3-642-68731-0Atom; EXAFS; Einkristall; Elektronenmikroskopie; Hochschmelzendes Metall; Kristallstrukturanalyse; Oberfl?
作者: 歡騰    時(shí)間: 2025-3-22 19:12

作者: adulterant    時(shí)間: 2025-3-22 21:55
Analytical Methods High-Melting Metals978-3-642-68731-0Series ISSN 0172-5076
作者: 殘廢的火焰    時(shí)間: 2025-3-23 01:55

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作者: Ingenuity    時(shí)間: 2025-3-23 17:27
,Diskursanalyse und Kritik – Einleitung,ablish the validity of the technique, little work has been done to obtain new information. In this chapter we will review some of this work. We assume that the reader has no prior knowledge of this technique and we will therefore review the theory of EXAFS, the methods of data analysis, and the experimental technique.
作者: Communal    時(shí)間: 2025-3-23 18:10

作者: puzzle    時(shí)間: 2025-3-24 00:26

作者: 虛假    時(shí)間: 2025-3-24 04:05
Diskursanalyse und feministische Kritik(en)ng mode makes the application of electron microscopy especially effective. Although already valuable information on crystal defects can be gained by using the routine technique of diffraction contrast imaging. which has a resolution of some10 nm — in the special weak-beam technique. of some nm -, th
作者: 地名表    時(shí)間: 2025-3-24 07:32
https://doi.org/10.1007/978-3-658-02180-1 microscopic investigations which revealed microtopography of surface structures and processes on the same monatomic layer level as the surface-analytical instruments both in the transmission (TEM) and the reflection (REM) modes. Useful accounts on recent surface electron microscopy have been given
作者: 噱頭    時(shí)間: 2025-3-24 13:02
0172-5076 gained by using the routine technique of diffraction contrast imagingl-3) which has a resolution of some 4 10 nm - in the special weak-beam technique ) of some978-3-642-68733-4978-3-642-68731-0Series ISSN 0172-5076
作者: 外星人    時(shí)間: 2025-3-24 18:02
High-Resolution Electron Microscopy of Crystals,ng mode makes the application of electron microscopy especially effective. Although already valuable information on crystal defects can be gained by using the routine technique of diffraction contrast imaging. which has a resolution of some10 nm — in the special weak-beam technique. of some nm -, th
作者: motor-unit    時(shí)間: 2025-3-24 20:26

作者: 神圣在玷污    時(shí)間: 2025-3-25 02:01
High-Resolution Electron Microscopy of Crystals,jor importance. For crystalline materials this connection is related to the lattice structure, and it can be shown convincingly that the material properties depend on deviations from the ideal lattice structure in the majority of cases. For this reason a reliable detection and analysis of defects in
作者: Delirium    時(shí)間: 2025-3-25 05:18
In-situ UHV Electron Microscopy of Surfaces,ethods like low energy electron diffraction (LEED), Auger electron spectroscopy (AES), UHV reflection high energy electron diffraction (RHEED) and others. Well-defined clean surfaces were prepared and maintained; structure and chemical compositions of the surfaces on the monatomic layer level were d
作者: 使聲音降低    時(shí)間: 2025-3-25 10:39
EXAFS Studies of Crystalline Materials, molecules, molecular structure of liquids, structure of amorphous semiconductors, and of supported catalysts. In view of the nature of this book and because other reviews on this subject exist (including a review by one of the authors.), this Chapter will focus on the applications of the EXAFS tech
作者: 意見一致    時(shí)間: 2025-3-25 14:55
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