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標(biāo)題: SCIE期刊IEEE Design & Test 2024/2025影響因子:1.909 (IEEE DES TEST) (2168-2356). (COMPUTER SCIENCE, HARDWARE & ARCHITECTURE)(計(jì) [打印本頁]

作者: 近地點(diǎn) 時(shí)間: 2025-3-21 19:13
SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)影響因子

SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)影響因子@(計(jì)算機(jī)科學(xué)，硬件與架構(gòu))學(xué)科排名

SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)總引論文

SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)總引論文@(計(jì)算機(jī)科學(xué)，硬件與架構(gòu))學(xué)科排名

SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)影響因子

SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)總引頻次@(計(jì)算機(jī)科學(xué)，硬件與架構(gòu))學(xué)科排名

SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)即時(shí)影響因子

SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)即時(shí)影響因子@(計(jì)算機(jī)科學(xué)，硬件與架構(gòu))學(xué)科排名

SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)五年累積影響因子

SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)五年累積影響因子@(計(jì)算機(jī)科學(xué)，硬件與架構(gòu))學(xué)科排名

作者: Fsh238 時(shí)間: 2025-3-21 22:15

作者: 苦笑 時(shí)間: 2025-3-22 02:29

作者: Osteoarthritis 時(shí)間: 2025-3-22 05:06
Submitted on: 15 July 2018. Revised on: 11 November 2018. Accepted on: 08 January 2019. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: 惡臭 時(shí)間: 2025-3-22 09:40
Submitted on: 28 June 2001. Revised on: 12 September 2001. Accepted on: 20 October 2001. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: 切割 時(shí)間: 2025-3-22 14:44

作者: Sputum 時(shí)間: 2025-3-22 18:57

作者: Emmenagogue 時(shí)間: 2025-3-23 00:21

作者: Fierce 時(shí)間: 2025-3-23 01:52
Submitted on: 16 April 2019. Revised on: 26 June 2019. Accepted on: 24 July 2019. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: IOTA 時(shí)間: 2025-3-23 06:14
Submitted on: 09 August 2007. Revised on: 11 November 2007. Accepted on: 16 December 2007. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: Celiac-Plexus 時(shí)間: 2025-3-23 10:06

作者: 依法逮捕 時(shí)間: 2025-3-23 16:15
Submitted on: 17 March 2007. Revised on: 26 April 2007. Accepted on: 24 June 2007. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: ASTER 時(shí)間: 2025-3-23 21:01
Submitted on: 21 May 2024. Revised on: 25 July 2024. Accepted on: 30 August 2024. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: B-cell 時(shí)間: 2025-3-24 01:08

作者: Mnemonics 時(shí)間: 2025-3-24 02:26

作者: Parabola 時(shí)間: 2025-3-24 08:12
Submitted on: 02 December 2020. Revised on: 09 February 2021. Accepted on: 27 March 2021. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: etidronate 時(shí)間: 2025-3-24 14:11
Submitted on: 03 March 2002. Revised on: 02 June 2002. Accepted on: 20 July 2002. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: 微生物 時(shí)間: 2025-3-24 15:14

作者: LUMEN 時(shí)間: 2025-3-24 20:10
Submitted on: 27 July 2016. Revised on: 11 September 2016. Accepted on: 10 October 2016. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: deciduous 時(shí)間: 2025-3-24 23:57
Submitted on: 23 September 2011. Revised on: 30 October 2011. Accepted on: 22 November 2011. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: subordinate 時(shí)間: 2025-3-25 06:31
Submitted on: 11 November 2020. Revised on: 25 February 2021. Accepted on: 10 April 2021. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: 策略 時(shí)間: 2025-3-25 10:35
Submitted on: 07 February 2008. Revised on: 20 May 2008. Accepted on: 25 June 2008. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: 美食家 時(shí)間: 2025-3-25 12:09

作者: abracadabra 時(shí)間: 2025-3-25 19:06

作者: Obsequious 時(shí)間: 2025-3-25 21:49
Submitted on: 24 April 1998. Revised on: 03 July 1998. Accepted on: 19 August 1998. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: 山間窄路 時(shí)間: 2025-3-26 01:58

作者: 和音 時(shí)間: 2025-3-26 05:11

作者: insolence 時(shí)間: 2025-3-26 11:44

作者: 擴(kuò)張 時(shí)間: 2025-3-26 15:21
Submitted on: 04 January 2015. Revised on: 26 January 2015. Accepted on: 23 March 2015. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: 種類 時(shí)間: 2025-3-26 19:13

作者: Truculent 時(shí)間: 2025-3-26 22:51

作者: 箴言 時(shí)間: 2025-3-27 04:09
Submitted on: 22 November 2022. Revised on: 21 March 2023. Accepted on: 24 April 2023. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: 支形吊燈 時(shí)間: 2025-3-27 06:27

作者: 具體 時(shí)間: 2025-3-27 12:44
Submitted on: 16 August 2018. Revised on: 13 November 2018. Accepted on: 04 December 2018. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: 蒼白 時(shí)間: 2025-3-27 17:02
Submitted on: 04 December 2016. Revised on: 18 January 2017. Accepted on: 09 February 2017. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: EVICT 時(shí)間: 2025-3-27 21:22
Submitted on: 01 January 2001. Revised on: 17 April 2001. Accepted on: 16 May 2001. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

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